0 works0 citations0 h-index

F. A. Stevie

North Carolina State University(US)

Publications by Year

Research Areas

Ion-surface interactions and analysis, Electron and X-Ray Spectroscopy Techniques, Integrated Circuits and Semiconductor Failure Analysis, Semiconductor materials and devices, Particle accelerators and beam dynamics

Most-Cited Works

→ A review of focused ion beam milling techniques for TEM specimen preparation(1999)1,177 cited
→ Introduction to Focused Ion Beams(2005)801 cited
→ Introduction to x-ray photoelectron spectroscopy(2020)488 cited
Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis(1989)
→ FIB Lift-Out Specimen Preparation Techniques(2005)101 cited
→ Application of focused ion beam lift‐out specimen preparation to TEM, SEM, STEM, AES and SIMS analysis(2001)97 cited
→ Effect of high temperature heat treatments on the quality factor of a large-grain superconducting radio-frequency niobium cavity(2013)86 cited

→ High fieldQslope and the baking effect: Review of recent experimental results and new data on Nb heat treatments(2010)

85 cited

→ Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique(1998)77 cited