M.P. Pagey
Space Micro (United States)(US)
Publications by Year
Research Areas
Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, Silicon Carbide Semiconductor Technologies
Most-Cited Works
- → Defects and nanocrystals generated by Si implantation into a-SiO/sub 2/(2000)41 cited
- → TCAD-assisted analysis of back-channel leakage in irradiated mesa SOI nMOSFETs(1998)25 cited
- → A hydrogen-transport-based interface-trap-generation model for hot-carrier reliability prediction(2001)18 cited
- Characterization and modeling of hot-carrier degradation in sub-micron NMOSFETS(2003)
- → SEU Mitigation for Reconfigurable FPGAs(2006)9 cited
- → Low Power, High-Speed Radiation Hardened Computer & Flight Experiment(2005)9 cited
- → Combined effect of X-irradiation and forming gas anneal on the hot-carrier response of MOS oxides(1993)5 cited
- → Geometrically optimized, Labr3: Ce scintillation sensor array for enhanced stand-off direction finding of gamma radiation sources(2007)5 cited
- → Unified model for n-channel hot-carrier degradation under different degradation mechanisms(1996)4 cited
- → Comparison of forming gas, nitrogen, and vacuum anneal effects on X-ray irradiated MOSFETs(1995)3 cited