Shinji Yokogawa
TEPCO (Japan)(JP)University of Electro-Communications(JP)
Publications by Year
Research Areas
Copper Interconnects and Reliability, Semiconductor materials and devices, Electronic Packaging and Soldering Technologies, Integrated Circuits and Semiconductor Failure Analysis, Infection Control and Ventilation
Most-Cited Works
- → New analysis methods for comprehensive understanding of Random Telegraph Noise(2009)110 cited
- → Direct observation of RTN-induced SRAM failure by accelerated testing and its application to product reliability assessment(2010)60 cited
- → Electromigration Performance of Multi-level Damascene Copper Interconnects(2001)54 cited
- → Electromigration lifetimes and void growth at low cumulative failure probability(2006)40 cited
- → Effects of Al doping on the electromigration performance of damascene Cu interconnects(2007)40 cited
- Single-charge-based modeling of transistor characteristics fluctuations based on statistical measurement of RTN amplitude(2006)
- → Analysis of Al Doping Effects on Resistivity and Electromigration of Copper Interconnects(2008)38 cited