Robert L. Billinger

Publications by Year

Research Areas

Microwave and Dielectric Measurement Techniques, Superconducting and THz Device Technology, Soil Moisture and Remote Sensing, Radio Frequency Integrated Circuit Design, Advanced MEMS and NEMS Technologies

Most-Cited Works

• → Precision measurement method for cryogenic amplifier noise temperatures below 5 K(2006)39 cited
• → Errors resulting from the reflectivity of calibration targets(2005)38 cited
• → Comparison of adapter characterization methods(1999)36 cited
• → Characterization and applications of on-wafer diode noise sources(1998)21 cited
• → On-wafer measurements of noise temperature(1999)14 cited
• → Measurement and uncertainty analysis of a cryogenic low‐noise amplifier with noise temperature below 2 K(2013)8 cited
• → Comparison of methods for adapter characterization(2003)7 cited
• → NFRAD - Review of the New Nist Noise Measurement System(2000)5 cited
• → A verification method for noise-temperature measurements on cryogenic low-noise amplifiers(2012)4 cited
• The Nist 30/60 MHz Tuned Radiometer for Noise Temperature Measurements(2018)