Mark Salomons
Publications by Year
Research Areas
Electron and X-Ray Spectroscopy Techniques, Advanced Electron Microscopy Techniques and Applications, Force Microscopy Techniques and Applications, Advanced Materials Characterization Techniques, Quantum and electron transport phenomena
Most-Cited Works
- → Atomic White-Out: Enabling Atomic Circuitry through Mechanically Induced Bonding of Single Hydrogen Atoms to a Silicon Surface(2017)77 cited
- → Silicon Atomic Quantum Dots Enable Beyond-CMOS Electronics(2014)51 cited
- → Low-energy electron point projection microscopy of suspended graphene, the ultimate ‘microscope slide’(2011)50 cited
- → Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface(2017)32 cited
- → Observation of FeGe skyrmions by electron phase microscopy with hole-free phase plate(2018)17 cited
- → Prediction of the resonant frequency of piezoelectric tube scanners through three-dimensional finite element modeling of a tube assembly(2008)15 cited
- → New fabrication technique for highly sensitive qPlus sensor with well-defined spring constant(2015)14 cited
- → Four-probe measurements with a three-probe scanning tunneling microscope(2014)8 cited
- → Iridium single atom tips fabricated by field assisted reactive gas etching(2016)7 cited