Randall Milanowski
Publications by Year
Research Areas
Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design, Radiation Effects in Electronics, Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing
Most-Cited Works
- → Modeling low-dose-rate effects in irradiated bipolar-base oxides(1998)55 cited
- → TCAD-assisted analysis of back-channel leakage in irradiated mesa SOI nMOSFETs(1998)25 cited
- → Substrate removal and BOX thinning effects on total dose response of FDSOI NMOSFET(2003)24 cited
- → Characterization and Analyses of RadHard-by-Design CMOS Quad Operational Amplifiers(2013)8 cited
- → Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC(2017)8 cited
- → Characterization and Analyses of RadHard-By-Design CMOS Open Drain Quad Comparators(2014)6 cited
- → Proton Radiation Effects on Hamamatsu InGaAs PIN Photodiodes(2017)6 cited
- → Combined effect of X-irradiation and forming gas anneal on the hot-carrier response of MOS oxides(1993)5 cited
- → Low-Dose-Rate Cobalt-60 Testing Results for Kaman KD-5100 Differential Inductive Position Measuring Systems(2018)5 cited
- → Proton Testing Results for Kaman KD-5100 Differential Inductive Position Measuring Systems(2017)5 cited