M. Hohl
Tofwerk (Switzerland)(CH)
Publications by Year
Research Areas
Mass Spectrometry Techniques and Applications, Plasma Diagnostics and Applications, Ion-surface interactions and analysis, Analytical chemistry methods development, Atomic and Molecular Physics
Most-Cited Works
- → High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument withIn SituAFM(2011)81 cited
- → Pulsed r.f.‐glow‐discharge time‐of‐flight mass spectrometry for fast surface and interface analysis of conductive and non‐conductive materials(2006)64 cited
- → A comparison of non-pulsed radiofrequency and pulsed radiofrequency glow discharge orthogonal time-of-flight mass spectrometry for analytical purposes(2009)53 cited
- → The concept of plasma cleaning in glow discharge spectrometry(2009)43 cited
- → DESIGN AND PERFORMANCE OF TWO ORTHOGONAL EXTRACTION TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETERS FOR FOCUSED ION BEAM INSTRUMENTS(2014)35 cited
- → Characterisation of a pulsed rf-glow discharge in view of its use in OES(2005)34 cited
- → Potential analytical applications of negative ions from a pulsed radiofrequency glow discharge in argon(2008)26 cited
- → Mass selective blanking in a compact multiple reflection time-of-flight mass spectrometer(1999)17 cited
- → Investigation of the density and temperature of electrons in a compact 2.45 GHz electron cyclotron resonance ion source plasma by x-ray measurements(2005)17 cited
- → Global plasma simulation of charge state distribution inside a 2.45 GHz ECR plasma with experimental verification(2010)6 cited