Christina L. Porter
ASML (Netherlands)(NL)ASML (Netherlands)(NL)
Publications by Year
Research Areas
Advanced X-ray Imaging Techniques, Advanced Electron Microscopy Techniques and Applications, Digital Holography and Microscopy, Laser-Plasma Interactions and Diagnostics, Near-Field Optical Microscopy
Most-Cited Works
- → Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source(2017)226 cited
- → Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using phase-sensitive EUV imaging reflectometry(2021)120 cited
- → Ptychographic hyperspectral spectromicroscopy with an extreme ultraviolet high harmonic comb(2016)65 cited
- → Quantitative Chemically Specific Coherent Diffractive Imaging of Reactions at Buried Interfaces with Few Nanometer Precision(2016)61 cited
- → General-purpose, wide field-of-view reflection imaging with a tabletop 13 nm light source(2017)46 cited
- → Full-field imaging of thermal and acoustic dynamics in an individual nanostructure using tabletop high harmonic beams(2018)40 cited
- → High-resolution wavefront sensing and aberration analysis of multi-spectral extreme ultraviolet beams(2023)34 cited
- → Spatial, spectral, and polarization multiplexed ptychography(2015)32 cited
- → Multiple beam ptychography for large field-of-view, high throughput, quantitative phase contrast imaging(2017)27 cited
- → Soft x-ray: novel metrology for 3D profilometry and device pitch overlay(2023)24 cited