Alexis Franquet
Imec the Netherlands(NL)
Publications by Year
Research Areas
Semiconductor materials and devices, Copper Interconnects and Reliability, Ion-surface interactions and analysis, Electronic and Structural Properties of Oxides, Integrated Circuits and Semiconductor Failure Analysis
Most-Cited Works
- → Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices(2014)334 cited
- → High-k dielectrics for future generation memory devices (Invited Paper)(2009)250 cited
- → Organic and perovskite solar cells for space applications(2018)212 cited
- → Effect of bath concentration and curing time on the structure of non-functional thin organosilane layers on aluminium(2003)168 cited
- → XPS study of the atmospheric corrosion of copper alloys of archaeological interest(2004)153 cited
- → Crystalline Properties and Strain Relaxation Mechanism of CVD Grown GeSn(2013)127 cited
- → Silane coating of metal substrates: Complementary use of electrochemical, optical and thermal analysis for the evaluation of film properties(2006)101 cited
- → Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry(2001)100 cited
- → Composition and thickness of non-functional organosilane films coated on aluminium studied by means of infra-red spectroscopic ellipsometry(2003)86 cited
- → Metal‐Insulator Transition in ALD VO2 Ultrathin Films and Nanoparticles: Morphological Control(2014)83 cited