Brett Engel
GlobalFoundries (United States)(US)GlobalFoundries (Germany)(DE)
Publications by Year
Research Areas
Integrated Circuits and Semiconductor Failure Analysis, Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design, VLSI and Analog Circuit Testing, Industrial Vision Systems and Defect Detection
Most-Cited Works
- → Thermal cycle reliability of stacked via structures with copper metallization and an organic low-k dielectric(2004)19 cited
- → Chasing ghosts: How an SRAM detected the subtle impact of stray light(2017)3 cited
- → Inline electrical yield versus optical inspection: Correlations, connections and disconnections(2016)2 cited
- → Fast Root Cause Identification Using Combination of Failure Analysis and In-Line Inspection(2017)