Christopher Szakal
National Institute of Standards and Technology(US)National Institute of Standards(EG)Material Measurement Laboratory(US)
Publications by Year
Research Areas
Ion-surface interactions and analysis, Diamond and Carbon-based Materials Research, Integrated Circuits and Semiconductor Failure Analysis, Mass Spectrometry Techniques and Applications, Metal and Thin Film Mechanics
Most-Cited Works
- → Measurement of Nanomaterials in Foods: Integrative Consideration of Challenges and Future Prospects(2014)134 cited
- → Molecular Depth Profiling of Histamine in Ice Using a Buckminsterfullerene Probe(2004)90 cited
- → Secondary Ion MS Imaging of Lipids in Picoliter Vials with a Buckminsterfullerene Ion Source(2005)71 cited
- → Improvements in SIMS continue(2006)70 cited
- → Sputtering Yields for C60 and Au3 Bombardment of Water Ice as a Function of Incident Kinetic Energy(2007)68 cited
- → C60 molecular depth profiling of a model polymer(2004)62 cited