F. A. Stevie
North Carolina State University(US)
Publications by Year
Research Areas
Ion-surface interactions and analysis, Integrated Circuits and Semiconductor Failure Analysis, Semiconductor materials and devices, Silicon and Solar Cell Technologies, Electron and X-Ray Spectroscopy Techniques
Most-Cited Works
- → Applications of the FIB lift-out technique for TEM specimen preparation(1998)293 cited
- → Focused Ion Beam Milling and Micromanipulation Lift-Out for Site Specific Cross-Section Tem Specimen Preparation(1997)156 cited
- → Secondary ion yield changes in Si and GaAs due to topography changes during O+2 or Cs+ ion bombardment(1988)155 cited
- Secondary Ion Mass Spectrometry SIMS XI(2003)
- → The Correlation between Ion Beam/Material Interactions and Practical FIB Specimen Preparation(2003)101 cited
- → Ion channeling effects on the focused ion beam milling of Cu(2001)98 cited
- → Applications of focused ion beams in microelectronics production, design and development(1995)71 cited