Claudia Fleischmann
IMEC(BE)KU Leuven(BE)
Publications by Year
Research Areas
Advanced Materials Characterization Techniques, Semiconductor materials and devices, Force Microscopy Techniques and Applications, Semiconductor materials and interfaces, Hydrogen embrittlement and corrosion behaviors in metals
Most-Cited Works
- → Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy(2014)70 cited
- → Enabling the high-performance InGaAs/Ge CMOS: a common gate stack solution(2009)60 cited
- → Bipolar device fabrication using a scanning tunnelling microscope(2020)47 cited
- → Dopant, composition and carrier profiling for 3D structures(2016)45 cited
- → Characterization of High-k Nanolayers by Grazing Incidence X-ray Spectrometry(2014)44 cited
- → Vertical Nanowire and Nanosheet FETs: Device Features, Novel Schemes for Improved Process Control and Enhanced Mobility, Potential for Faster & More Energy Efficient Circuits(2019)39 cited
- → Selecting alternative metals for advanced interconnects(2024)35 cited
- → Relaxor Ferroelectricity and Magnetoelectric Coupling in ZnO–Co Nanocomposite Thin Films: Beyond Multiferroic Composites(2014)35 cited
- → Toward accurate composition analysis of GaN and AlGaN using atom probe tomography(2018)31 cited
- → The influence of interface roughness on the magnetic properties of exchange biased CoO/Fe thin films(2010)31 cited