Hidetaka Sawada
JEOL (Japan)(JP)
Publications by Year
Research Areas
Electron and X-Ray Spectroscopy Techniques, Advanced Electron Microscopy Techniques and Applications, Advanced X-ray Imaging Techniques, Integrated Circuits and Semiconductor Failure Analysis, Force Microscopy Techniques and Applications
Most-Cited Works
- → Differential phase-contrast microscopy at atomic resolution(2012)456 cited
- → Dynamics of annular bright field imaging in scanning transmission electron microscopy(2010)441 cited
- → Robust atomic resolution imaging of light elements using scanning transmission electron microscopy(2009)374 cited
- → Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy(2011)361 cited
- → Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy(2009)202 cited
- → STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun(2009)170 cited
- → Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage