G. Benner
Carl Zeiss (Germany)(DE)
Publications by Year
Research Areas
Electron and X-Ray Spectroscopy Techniques, Advanced Electron Microscopy Techniques and Applications, Advanced X-ray Imaging Techniques, Advancements in Photolithography Techniques, Advanced Materials Characterization Techniques
Most-Cited Works
- → Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene(2012)447 cited
- → Transmission electron microscopy at 20kV for imaging and spectroscopy(2011)201 cited
- → Visualizing a Homogeneous Blend in Bulk Heterojunction Polymer Solar Cells by Analytical Electron Microscopy(2011)161 cited
- → SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II(1997)154 cited
- → XPEEM WITH ENERGY-FILTERING: ADVANTAGES AND FIRST RESULTS FROM THE SMART PROJECT(2002)96 cited
- → SMART: An Aberration-Corrected XPEEM/LEEM with Energy Filter(1998)86 cited
- → High-energy collective electronic excitations in free-standing single-layer graphene(2013)86 cited
- → Direct probe of linearly dispersing 2D interband plasmons in a free-standing graphene monolayer(2012)81 cited
- → SESAM: Exploring the Frontiers of Electron Microscopy(2006)79 cited
- → Energy resolution of an Omega-type monochromator and imaging properties of the MANDOLINE filter(2010)56 cited