Jae Yeon Baek
University of California, Berkeley(US)
Publications by Year
Research Areas
Industrial Vision Systems and Defect Detection, Advancements in Photolithography Techniques, Optical Coatings and Gratings, Near-Field Optical Microscopy, Surface Roughness and Optical Measurements
Most-Cited Works
- → High-performance Si microwire photovoltaics(2011)199 cited
- → Optimal Training and Efficient Model Selection for Parameterized Large Margin Learning(2016)8 cited
- → Predicting Congressional Votes Based on Campaign Finance Data(2012)6 cited
- → Optimization of blended virtual and actual metrology schemes(2012)6 cited
- → Real-time inspection system utilizing scatterometry pupil data(2014)2 cited
- → Performance Evaluation of Blended Metrology Schemes Incorporating Virtual Metrology(2013)1 cited
- → Enhancing metrology by combining spatial variability and global inference(2013)1 cited
- Modeling and Selection for Real-time Wafer-to-Wafer Fault Detection Applications(2015)