J. Franco
Harvard University(US)IMEC(BE)
Publications by Year
Research Areas
Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design, Integrated Circuits and Semiconductor Failure Analysis, Ferroelectric and Negative Capacitance Devices, Thin-Film Transistor Technologies
Most-Cited Works
- → The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps(2011)464 cited
- → Origin of NBTI variability in deeply scaled pFETs(2010)304 cited
- → Comphy — A compact-physics framework for unified modeling of BTI(2018)200 cited
- → Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise(2009)114 cited
- → Recent advances in understanding the bias temperature instability(2010)105 cited
- → SiGe Channel Technology: Superior Reliability Toward Ultrathin EOT Devices—Part I: NBTI(2012)102 cited
- → A unified perspective of RTN and BTI