Dominic Windisch
Technische Universität Dresden(DE)
Publications by Year
Research Areas
Medical Imaging Techniques and Applications, Advanced X-ray Imaging Techniques, Advanced X-ray and CT Imaging, Silicon and Solar Cell Technologies, Optical measurement and interference techniques
Most-Cited Works
- → Silicon lattice parameters as an absolute scale of length for high precision measurements of fundamental constants(1990)146 cited
- → A determination of the Avogadro Constant(1992)99 cited
- → Lattice distortions induced by carbon in silicon(1988)86 cited
- → Remeasurement of the CuKα1 Emission X-Ray Wavelength in the Metrical System (Present Stage)(1991)57 cited
- → Angular measurements with X-ray interferometry(1992)37 cited
- → High precision x-ray metrology(1988)18 cited
- → Real-time data processing for ultrafast X-ray computed tomography using modular CUDA based pipelines(2023)9 cited
- → FPGA-Based Real-Time Data Acquisition for Ultrafast X-Ray Computed Tomography(2021)9 cited
- → Parallel Algorithm for Connected-Component Analysis Using CUDA(2023)9 cited
- → A Smart Multi-Plane Detector Design for Ultrafast Electron Beam X-ray Computed Tomography(2020)9 cited