C. Kisielowski
Lawrence Berkeley National Laboratory(US)
Publications by Year
Research Areas
Electron and X-Ray Spectroscopy Techniques, Advanced Electron Microscopy Techniques and Applications, GaN-based semiconductor devices and materials, Semiconductor materials and devices, Advanced Materials Characterization Techniques
Most-Cited Works
- → Graphene at the Edge: Stability and Dynamics(2009)1,256 cited
- → Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes(2008)1,219 cited
- → Strain-related phenomena in GaN thin films(1996)881 cited
- → Grain Boundary Mapping in Polycrystalline Graphene(2011)630 cited
- → Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit(2008)301 cited
- → Interface Structure and Atomic Bonding Characteristics in Silicon Nitride Ceramics(2004)234 cited
- → Layer Resolved Structural Relaxation at the Surface of Magnetic FePt Icosahedral Nanoparticles(2008)