M. Szlachetko
University of Fribourg(CH)Paul Scherrer Institute(CH)
Publications by Year
Research Areas
X-ray Spectroscopy and Fluorescence Analysis, Electron and X-Ray Spectroscopy Techniques, Ion-surface interactions and analysis, Advanced X-ray Imaging Techniques, Atomic and Molecular Physics
Most-Cited Works
- → A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies(2012)172 cited
- → Physical Mechanisms and Scaling Laws ofK-Shell Double Photoionization(2009)71 cited
- → In situ hard X-ray quick RIXS to probe dynamic changes in the electronic structure of functional materials(2012)34 cited
- → High-Resolution Study of X-Ray Resonant Raman Scattering at theKEdge of Silicon(2006)30 cited
- → High-resolution Laue-type DuMond curved crystal spectrometer(2013)28 cited
- → Relative detection efficiency of back- and front-illuminated charge-coupled device cameras for x-rays between 1keV and 18keV(2007)28 cited
- → Application of the high-resolution grazing-emission x-ray fluorescence method for impurities control in semiconductor nanotechnology(2009)28 cited
- → High-resolution study of the x-ray resonant Raman scattering process around the1sabsorption edge for aluminium, silicon, and their oxides(2007)25 cited
- → Observation of ultralow-level Al impurities on a silicon surface by high-resolution grazing emission x-ray fluorescence excited by synchrotron radiation(2009)24 cited
- → DoubleK-shell photoionization and hypersatellite x-ray transitions of12⩽Z⩽23atoms(2010)24 cited