Daniel Vala
VSB - Technical University of Ostrava(CZ)Palacký University Olomouc(CZ)
Publications by Year
Research Areas
Optical Polarization and Ellipsometry, Terahertz technology and applications, Molecular spectroscopy and chirality, 2D Materials and Applications, Plasmonic and Surface Plasmon Research
Most-Cited Works
- → One-dimensional photonic crystal for Bloch surface waves and radiation modes-based sensing(2019)42 cited
- → Layer‐controlled nonlinear terahertz valleytronics in two‐dimensional semimetal and semiconductor PtSe2(2023)22 cited
- → Maximizing the Electromagnetic Efficiency of Spintronic Terahertz Emitters(2024)13 cited
- → Effects of optical activity to Mueller matrix ellipsometry of composed waveplates(2021)9 cited
- → Determining Bandgaps in the Layered Group‐10 2D Transition Metal Dichalcogenide PtSe2(2024)8 cited
- → Broadband Mueller ellipsometer as an all-in-one tool for spectral and temporal analysis of mutarotation kinetics(2023)8 cited
- → Mueller matrix ellipsometry of waveplates for control of their properties and alignment(2019)5 cited
- → Diffractive order Mueller matrix ellipsometry for the design and manufacture of polarization beam splitting metasurfaces(2023)5 cited
- → Optical activity temperature-dependent measurements of chiral solutions using Mueller matrix spectroscopic ellipsometry(2018)2 cited