F. Miller
University of Minnesota(US)University of Wisconsin–Madison(US)Twin Cities Orthopedics(US)LFB (France)(FR)
Publications by Year
Research Areas
Radiation Effects in Electronics, Integrated Circuits and Semiconductor Failure Analysis, Semiconductor materials and devices, VLSI and Analog Circuit Testing, Radiation Detection and Scintillator Technologies
Most-Cited Works
- → Pulsed-Laser Testing for Single-Event Effects Investigations(2013)163 cited
- → Sensitive Volume and Triggering Criteria of SEB in Classic Planar VDMOS(2010)66 cited
- → Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL(2012)51 cited
- → Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment(2014)49 cited
- → Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications(2013)48 cited
- → Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser Testing(2006)48 cited