Julien Baderot
Publications by Year
Research Areas
Industrial Vision Systems and Defect Detection, Electron and X-Ray Spectroscopy Techniques, Advancements in Photolithography Techniques, Image Processing Techniques and Applications, Integrated Circuits and Semiconductor Failure Analysis
Most-Cited Works
- → Application of deep-learning based techniques for automatic metrology on scanning and transmission electron microscopy images(2022)9 cited
- → The coming of age of the first hybrid metrology software platform dedicated to nanotechnologies (Conference Presentation)(2017)5 cited
- → Cognitive learning: a machine learning approach for automatic process characterization from design(2018)5 cited
- → Designed tools for analysis of lithography patterns and nanostructures(2017)4 cited
- → Deep learning contour-based method for semi-automatic annotation of manufactured objects in electron microscopy images(2024)3 cited
- → Application of machine learning-based metrology for writer main pole CD measurement by CDSEM(2022)2 cited
- → Deep learning aided tool for fast and accurate segmentation of multi-part semiconductor features(2024)2 cited
- → A generic deep-learning-based defect segmentation model for electron micrographs for automatic defect inspection(2023)2 cited
- → Semi-automatic tools for nanoscale metrology and annotations for deep learning automation on electron microscopy images(2023)2 cited
- → Tree of Shapes Cut for Material Segmentation Guided by a Design(2020)2 cited