Taleana Huff
Publications by Year
Research Areas
Force Microscopy Techniques and Applications, Molecular Junctions and Nanostructures, Surface and Thin Film Phenomena, Electron and X-Ray Spectroscopy Techniques, Quantum and electron transport phenomena
Most-Cited Works
- → Lithography for robust and editable atomic-scale silicon devices and memories(2018)121 cited
- → Atomic White-Out: Enabling Atomic Circuitry through Mechanically Induced Bonding of Single Hydrogen Atoms to a Silicon Surface(2017)77 cited
- → SiQAD: A Design and Simulation Tool for Atomic Silicon Quantum Dot Circuits(2020)64 cited
- → Atomically Precise Manufacturing of Silicon Electronics(2024)54 cited
- → Initiating and Monitoring the Evolution of Single Electrons Within Atom-Defined Structures(2018)48 cited
- → Electrostatic Landscape of a Hydrogen-Terminated Silicon Surface Probed by a Moveable Quantum Dot(2019)42 cited
- → Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface(2017)32 cited
- → Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy(2020)20 cited
- → Detecting and Directing Single Molecule Binding Events on H-Si(100) with Application to Ultradense Data Storage(2019)20 cited
- → Resolving and Tuning Carrier Capture Rates at a Single Silicon Atom Gap State(2017)19 cited