R. Baumann
The University of Texas at Dallas(US)TU Dresden(DE)
Publications by Year
Research Areas
Radiation Effects in Electronics, Semiconductor materials and devices, VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Photorefractive and Nonlinear Optics
Most-Cited Works
- → Radiation-induced soft errors in advanced semiconductor technologies(2005)1,398 cited
- → Soft Errors in Advanced Computer Systems(2005)824 cited
- → AGATA—Advanced GAmma Tracking Array(2011)448 cited
- → Soft errors in advanced semiconductor devices-part I: the three radiation sources(2001)401 cited
- → The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction(2003)314 cited
- → Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions(2009)192 cited
- →