H. Park
AT&T (United States)(US)Stanford University(US)
Publications by Year
Research Areas
Crystallography and Radiation Phenomena, Advanced X-ray Imaging Techniques, X-ray Spectroscopy and Fluorescence Analysis, Microstructure and mechanical properties, Low-power high-performance VLSI design
Most-Cited Works
- → Thermal-vibrational amplitudes of silicon determined by channeling-radiation measurements(1991)20 cited
- → Electron and positron channeling radiation from beryllium oxide(1993)4 cited
- → Channeling Radiation Experiments between 10 and 100 MeV(1987)4 cited
- → The Study of Material Properties Using Channeling Radiation(1987)4 cited
- → A multimode PCM transceiver chip for 1.544-Mbit/s digital telecommunications(1988)