M. V. R. K. Murty
Broadcom (United States)(US)
Publications by Year
Research Areas
Photonic and Optical Devices, Advanced Measurement and Metrology Techniques, Optical Coatings and Gratings, Semiconductor Lasers and Optical Devices, Optical measurement and interference techniques
Most-Cited Works
- → Observation of Nanoscale180°Stripe Domains in FerroelectricPbTiO3Thin Films(2002)498 cited
- → Rice responses to rising temperatures – challenges, perspectives and future directions(2014)338 cited
- → General Ray-Tracing Procedure†(1962)320 cited
- → The Use of a Single Plane Parallel Plate as a Lateral Shearing Interferometer with a Visible Gas Laser Source(1964)239 cited
- → RiceAtlas, a spatial database of global rice calendars and production(2017)205 cited
- → Empirical interatomic potential for Si-H interactions(1995)103 cited
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