Thomas Schmidt
University of Bremen(DE)Fritz Haber Institute of the Max Planck Society(DE)
Publications by Year
Research Areas
Surface and Thin Film Phenomena, Electron and X-Ray Spectroscopy Techniques, Semiconductor materials and devices, Semiconductor Quantum Structures and Devices, Advanced Chemical Physics Studies
Most-Cited Works
- → Superradiance of quantum dots(2007)481 cited
- → High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies(2010)377 cited
- → The Materials Science beamline upgrade at the Swiss Light Source(2013)292 cited
- → Chemical bonding of PTCDA on Ag surfaces and the formation of interface states(2006)270 cited
- → SPELEEM: Combining LEEM and Spectroscopic Imaging(1998)244 cited
- → Spatiotemporal Stability of a Femtosecond Hard–X-Ray Undulator Source Studied by Control of Coherent Optical Phonons(2007)186 cited