L. W. Massengill
Vanderbilt University(US)Reliable Software Resources (United States)(US)
Publications by Year
Research Areas
Radiation Effects in Electronics, VLSI and Analog Circuit Testing, Semiconductor materials and devices, Integrated Circuits and Semiconductor Failure Analysis, Low-power high-performance VLSI design
Most-Cited Works
- → Basic mechanisms and modeling of single-event upset in digital microelectronics(2003)1,105 cited
- → Charge Collection and Charge Sharing in a 130 nm CMOS Technology(2006)394 cited
- → Single Event Transients in Digital CMOS—A Review(2013)385 cited
- → Monte Carlo Simulation of Single Event Effects(2010)218 cited
- → Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies(2007)170 cited
- → The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM(2005)169 cited