A. Cricenti
Institute of Structure of Matter(IT)National Research Council(IT)
Publications by Year
Research Areas
Force Microscopy Techniques and Applications, Surface and Thin Film Phenomena, Near-Field Optical Microscopy, Electron and X-Ray Spectroscopy Techniques, Integrated Circuits and Semiconductor Failure Analysis
Most-Cited Works
- → Differential Reflectivity of Si(111)2×1 Surface with Polarized Light: A Test for Surface Structure(1984)249 cited
- → Self-aligned silicon quantum wires on Ag(110)(2004)147 cited
- → Roughness of the plasma membrane as an independent morphological parameter to study RBCs: A quantitative atomic force microscopy investigation(2007)144 cited
- → Graphene nanoribbons produced by the oxidative unzipping of single-wall carbon nanotubes(2010)131 cited
- → Surface differential reflectivity spectroscopy of semiconductor surfaces(1987)99 cited
- → Photoemission study of the surface states that pin the Fermi level at Si(100)2 × 1 surfaces(1986)94 cited