Elina Färm
University of Helsinki(FI)ASM International (Finland)(FI)
Publications by Year
Research Areas
Advanced X-ray Imaging Techniques, Semiconductor materials and devices, X-ray Spectroscopy and Fluorescence Analysis, Diamond and Carbon-based Materials Research, Advanced Electron Microscopy Techniques and Applications
Most-Cited Works
- → X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution(2014)349 cited
- → Nanofocusing of hard X-ray free electron laser pulses using diamond based Fresnel zone plates(2011)141 cited
- → Ultra-high resolution zone-doubled diffractive X-ray optics for the multi-keV regime(2010)118 cited
- → Selective-Area Atomic Layer Deposition Using Poly(methyl methacrylate) Films as Mask Layers(2008)106 cited
- → Surface modification of thermoplastics by atomic layer deposition of Al2O3 and TiO2 thin films(2008)95 cited
- → Selective-Area Atomic Layer Deposition Using Poly(vinyl pyrrolidone) as a Passivation Layer(2009)68 cited
- → Selective-area atomic layer deposition with microcontact printed self-assembled octadecyltrichlorosilane monolayers as mask layers(2008)67 cited
- → Self‐Assembled Octadecyltrimethoxysilane Monolayers Enabling Selective‐Area Atomic Layer Deposition of Iridium(2006)61 cited
- → High resolution double-sided diffractive optics for hard X-ray microscopy(2015)56 cited
- → Dense high aspect ratio hydrogen silsesquioxane nanostructures by 100 keV electron beam lithography(2010)55 cited