Robert A. Reed
University of Colorado Boulder(US)Vanderbilt University(US)
Publications by Year
Research Areas
Radiation Effects in Electronics, Semiconductor materials and devices, Integrated Circuits and Semiconductor Failure Analysis, Advancements in Semiconductor Devices and Circuit Design, VLSI and Analog Circuit Testing
Most-Cited Works
- → Monte Carlo Simulation of Single Event Effects(2010)218 cited
- → Evaluation of Hydroperoxides in Common Pharmaceutical Excipients(2006)202 cited
- → Scale dependence of vegetation‐environment correlations: A case study of a North Carolina piedmont woodland(1993)197 cited
- → Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions(2009)192 cited
- → The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM(2005)169 cited
- → Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors(2013)144 cited