Y. Hayashi
Kōchi University(JP)
Publications by Year
Research Areas
Semiconductor materials and devices, Copper Interconnects and Reliability, 3D IC and TSV technologies, Advancements in Semiconductor Devices and Circuit Design, Ferroelectric and Negative Capacitance Devices
Most-Cited Works
- → Sol-gel derived PbTiO3(1987)193 cited
- → Statistical characterization of trap position, energy, amplitude and time constants by RTN measurement of multiple individual traps(2010)133 cited
- → New analysis methods for comprehensive understanding of Random Telegraph Noise(2009)110 cited
- → 13.4 A 6.3mW BLE transceiver embedded RX image-rejection filter and TX harmonic-suppression filter reusing on-chip matching network(2015)85 cited
- → Preparation of rod-shaped BaTiO3 powder(1986)70 cited
- → Direct observation of RTN-induced SRAM failure by accelerated testing and its application to product reliability assessment(2010)60 cited