Xiaoqing Wen
Kyushu Institute of Technology(JP)China State Construction Engineering (China)(CN)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, Low-power high-performance VLSI design, Semiconductor materials and devices
Most-Cited Works
- VLSI Test Principles and Architectures: Design for Testability(2006)
- → Power-Aware Testing and Test Strategies for Low Power Devices(2009)158 cited
- → A Secure and Multiobjective Virtual Machine Placement Framework for Cloud Data Center(2021)128 cited
- → Low-capture-power test generation for scan-based at-speed testing(2006)125 cited
- VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)(2006)
- → Design for Testability(2006)118 cited
- → Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS(2018)109 cited