A.Y. Wong
Hong Kong Polytechnic University(HK)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Industrial Vision Systems and Defect Detection, Integrated Circuits and Semiconductor Failure Analysis, Advanced Statistical Process Monitoring, Network Traffic and Congestion Control
Most-Cited Works
- A Statistical Parametric and Probe Yield Analysis Methodology(1996)
- → A statistical parametric and probe yield analysis methodology [IC manufacture](2002)11 cited
- → A systematic approach to identify critical yield sensitive parametric parameters(2002)8 cited
- → A statistical approach to identify semiconductor process equipment related yield problems(2002)6 cited
- → Micro yield modeling for IC processes(2002)4 cited
- → A Novel Internet Real-Time Traffic Pattern Detection Technique for Better Pervasive Computing(2006)3 cited