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B. L. Bhuva

Vanderbilt University(US)Kamdhenu University(IN)

Publications by Year

Research Areas

Radiation Effects in Electronics, VLSI and Analog Circuit Testing, Semiconductor materials and devices, Integrated Circuits and Semiconductor Failure Analysis, Low-power high-performance VLSI design

Most-Cited Works

→ Charge Collection and Charge Sharing in a 130 nm CMOS Technology(2006)394 cited
→ Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies(2007)170 cited
→ Comparison of Combinational and Sequential Error Rates for a Deep Submicron Process(2011)147 cited
→ On-Chip Characterization of Single-Event Transient Pulsewidths(2006)146 cited
→ Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits(2009)144 cited
→ RHBD techniques for mitigating effects of single-event hits using guard-gates(2005)142 cited

→ Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node(2011)

123 cited

→ HBD layout isolation techniques for multiple node charge collection mitigation(2005)122 cited

→ Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing(2008)109 cited

→ Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology(2007)105 cited