Andrew Yi-Ann Huang
University of California, Los Angeles(US)e2e Services (United Kingdom)(GB)
Publications by Year
Research Areas
Industrial Vision Systems and Defect Detection, Integrated Circuits and Semiconductor Failure Analysis, Advancements in Photolithography Techniques, Advanced Surface Polishing Techniques, Venous Thromboembolism Diagnosis and Management
Most-Cited Works
- → PENet—a scalable deep-learning model for automated diagnosis of pulmonary embolism using volumetric CT imaging(2020)177 cited
- → Machine Learning-Based Detection Method for Wafer Test Induced Defects(2021)55 cited
- → Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning(2022)25 cited
- → PENet - A Scalable Deep-Learning Model for Automated Diagnosis of Pulmonary Embolism Using Volumetric CT Imaging(2019)15 cited
- → Hidden Wafer Scratch Defects Projection for Diagnosis and Quality Enhancement(2020)15 cited
- → Author Correction: PENet—a scalable deep-learning model for automated diagnosis of pulmonary embolism using volumetric CT imaging(2020)11 cited
- → TestDNA: Novel Wafer Defect Signature for Diagnosis and Pattern Recognition(2020)9 cited
- → Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis(2020)8 cited
- → TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning(2022)8 cited
- → Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization(2022)8 cited