Sergio Martinez
Instituto Politécnico Nacional(MX)
Publications by Year
Research Areas
Electron and X-Ray Spectroscopy Techniques, Industrial Vision Systems and Defect Detection, Advancements in Photolithography Techniques, Advanced Measurement and Metrology Techniques, Image Processing Techniques and Applications
Most-Cited Works
- → Application of deep-learning based techniques for automatic metrology on scanning and transmission electron microscopy images(2022)9 cited
- → Application of machine learning-based metrology for writer main pole CD measurement by CDSEM(2022)2 cited
- → A generic deep-learning-based defect segmentation model for electron micrographs for automatic defect inspection(2023)2 cited
- → Semi-automatic tools for nanoscale metrology and annotations for deep learning automation on electron microscopy images(2023)2 cited
- → Metrospection holistic AI-driven process control software platform dedicated to metrology and defectivity for patterning process at die and wafer levels(2024)1 cited
- → Gemini Robotics 1.5: Pushing the Frontier of Generalist Robots with Advanced Embodied Reasoning, Thinking, and Motion Transfer(2025)
- A generic deep-learning based defect segmentation model for electron micrographs for automatic defect inspection(2023)
- → Metrology and segmentation in SEM/TEM imaging: accelerating semiconductor analysis through advanced deep learning techniques(2025)
- → Autonomous Drone System for Real-Time People Detection and Crowd Flow Analysis Using Machine Learning Algorithms(2025)
- → Scalable and adaptable structural metrology for AR/VR device images based on deep learning(2024)