Frank Scholze
Physikalisch-Technische Bundesanstalt(DE)Physikalisch-Technische Bundesanstalt(DE)
Publications by Year
Research Areas
Advancements in Photolithography Techniques, X-ray Spectroscopy and Fluorescence Analysis, Calibration and Measurement Techniques, Electron and X-Ray Spectroscopy Techniques, Optical Coatings and Gratings
Most-Cited Works
- → Mean energy required to produce an electron-hole pair in silicon for photons of energies between 50 and 1500 eV(1998)144 cited
- → A quarter‐century of metrology using synchrotron radiation by PTB in Berlin(2009)130 cited
- → Modelling the response function of energy dispersive X‐ray spectrometers with silicon detectors(2009)129 cited
- → Recent developments of wide-bandgap semiconductor based UV sensors(2008)112 cited
- → X-ray CCD calibration for the AXAF CCD Imaging Spectrometer(1998)97 cited
- → High-accuracy radiometry in the EUV range at the PTB soft x-ray beamline(2003)96 cited