Hak Kim
Science Systems and Applications (United States)(US)
Publications by Year
Research Areas
Radiation Effects in Electronics, Integrated Circuits and Semiconductor Failure Analysis, Semiconductor materials and devices, VLSI and Analog Circuit Testing, Advanced Memory and Neural Computing
Most-Cited Works
- → Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions(2009)192 cited
- → Space Radiation Effects on SiC Power Device Reliability(2021)91 cited
- → 32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches(2011)59 cited
- → Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs(2008)53 cited
- → Single-Event Effect Performance of a Commercial Embedded ReRAM(2014)44 cited
- → Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory(2017)43 cited
- → Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies(2014)37 cited
- → The effects of operating bias conditions on the proton tolerance of SiGe HBTs(2003)35 cited
- → An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays(2006)35 cited
- → Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA(2012)26 cited