X. F. Duan
University of Shanghai for Science and Technology(CN)
Publications by Year
Research Areas
Semiconductor materials and interfaces, Electron and X-Ray Spectroscopy Techniques, Semiconductor materials and devices, Advanced Electron Microscopy Techniques and Applications, Boron and Carbon Nanomaterials Research
Most-Cited Works
- → In situ electron holography study of charge distribution in high-κ charge-trapping memory(2013)70 cited
- → Investigation on optical properties of ZnO nanowires by electron energy-loss spectroscopy(2005)50 cited
- → Direct Observation of Incommensurate Modulation in Phase-Separated Cu-RichLa2CuO4.003(1998)27 cited
- → Effects of elastic relaxation on large-angle convergent-beam electron diffraction from cross-sectional specimens of GexSi1−x/Si strained-layer superlattices(1994)27 cited
- → Coexistence of superconductivity and ferromagnetism in a dilute cobalt-dopedLa1.89Ce0.11CuO4±δsystem(2006)15 cited
- → Transmission electron microscopy investigation of crystalline silicon surface irradiated by femtosecond laser pulses in different background atmospheres(2012)14 cited
- → Thin film relaxation in cross-sectional transmission electron microscopy specimens of GexSi1−x/Si strained-layer superlattices(1995)14 cited
- → High-resolution shadow image superimposed on LACBED patterns: a method demonstrated on GexSi1−x/Si superlattice(1992)14 cited
- → Convergent-beam electron diffraction and X-ray diffraction characterization of strained-layer superlattices(1991)13 cited
- → Nanoscale strain analysis of strained-Si metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction(2006)10 cited