U. Schröder
NaMLab (Germany)(DE)
Publications by Year
Research Areas
Semiconductor materials and devices, Ferroelectric and Negative Capacitance Devices, Ferroelectric and Piezoelectric Materials, Electronic and Structural Properties of Oxides, Advanced Memory and Neural Computing
Most-Cited Works
- → Ferroelectricity in hafnium oxide thin films(2011)2,609 cited
- → Ferroelectricity in Simple Binary ZrO2 and HfO2(2012)1,684 cited
- → Ferroelectricity in yttrium-doped hafnium oxide(2011)678 cited
- → Ferroelectric Zr0.5Hf0.5O2 thin films for nonvolatile memory applications(2011)570 cited
- → Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories(2013)482 cited
- → Wake-up effects in Si-doped hafnium oxide ferroelectric thin films(2013)386 cited
- → Phase transitions in ferroelectric silicon doped hafnium oxide(2011)366 cited
- → Ferroelectricity in hafnium oxide: CMOS compatible ferroelectric field effect transistors(2011)342 cited
- → Ferroelectricity in HfO2 enables nonvolatile data storage in 28 nm HKMG(2012)281 cited
- → Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin films(2012)185 cited