Yung-Tao Lin
Taiwan Semiconductor Manufacturing Company (Taiwan)(TW)
Publications by Year
Research Areas
Semiconductor materials and devices, Industrial Vision Systems and Defect Detection, Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis, Advancements in Semiconductor Devices and Circuit Design
Most-Cited Works
- → Properties of interconnection on silicon, sapphire, and semi-insulating gallium arsenide substrates(1982)51 cited
- → An Unusual Lightning Flash at Kennedy Space Center(1978)51 cited
- → Novel program versus disturb window characterization for split-gate flash cell(2005)12 cited
- → A novel program disturb mechanism through erase gate in a 110nm sidewall split-gate Flash memory cell(2011)7 cited
- → Enhanced-performance 4K × 1 high-speed SRAM using optically defined submicrometer devices in selected circuits(1982)7 cited
- → Modeling of defect propagation/growth for yield impact prediction in VLSI manufacturing(1997)5 cited
- → Study of circuit sensitivity to interconnect variation(2002)4 cited
- → Rigorous topography simulation of contamination to defect transformation(2002)3 cited
- → On Application of Analytical Model for Drain-Coupling Split-Gate Flash: Analytical Solution to Source-Side Injection Multilevel Programming(2006)2 cited