M. Zeller
Publications by Year
Research Areas
Crystallization and Solubility Studies, X-ray Diffraction in Crystallography, Semiconductor materials and devices, Silicon Carbide Semiconductor Technologies, Metal and Thin Film Mechanics
Most-Cited Works
- → Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis(1981)2,051 cited
- → Photoelectron spectroscopy of tin compounds(1973)142 cited
- → X-ray photoelectron spectroscopic studies on the electronic structures of porphyrin and phthalocyanine compounds(1973)109 cited
- → The correlation of chemical structure and electrical conductivity in polypyrrole films by x‐ray photoelectron spectroscopy(1988)45 cited
- → Surface Chemistry of Perfluoro Ethers: An Infrared Study of the Thermal Decomposition of (C2F5)2O on Al2O3(1995)40 cited
- → Scanning tunneling microscope tip structures(1988)39 cited
- → Auger and infrared study of polypyrrole films: Evidence of chemical changes during electrochemical deposition and aging in air(1986)38 cited
- → High Frequency Capacitance‐Voltage Characteristics of Thermally Grown SiO2 Films on β ‐ SiC(1990)36 cited
- → Surface modification strategies for (100)3C-SiC(1986)35 cited
- → Stoichiometric changes in the surface of (100) cubic SiC caused by ion bombardment and annealing(1986)30 cited