W. F. Egelhoff
National Institute of Standards and Technology(US)Physical Measurement Laboratory(US)Material Measurement Laboratory(US)
Publications by Year
Research Areas
Magnetic properties of thin films, Magnetic Properties and Applications, ZnO doping and properties, Copper Interconnects and Reliability, Advanced Chemical Physics Studies
Most-Cited Works
- → Core-level binding-energy shifts at surfaces and in solids(1987)755 cited
- → X-Ray photoelectron and auger electroo forward scattering: A new tool for surface crystallography(1990)349 cited
- → Growth and structure of Fe and Co thin films on Cu(111), Cu(100), and Cu(110): A comprehensive study of metastable film growth(1993)293 cited
- → Concurrent enhancement of Kerr rotation and antiferromagnetic coupling in epitaxial Fe/Cu/Fe structures(1990)254 cited
- → X-ray photoelectron and Auger-electron forward scattering: A new tool for studying epitaxial growth and core-level binding-energy shifts(1984)215 cited
- → Oxygen as a surfactant in the growth of giant magnetoresistance spin valves(1997)195 cited