Kozo Kinoshita
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Low-power high-performance VLSI design, Radiation Effects in Electronics, Software Testing and Debugging Techniques
Most-Cited Works
- → Built-In Self-Testing RAM: A Practical Alternative(1987)55 cited
- → Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits(1993)48 cited
- → Test Generation for Scan Design Circuits with Tri-State Modules and Bidirectional Terminals(1983)21 cited
- → On Magnetic Bubble Logic Circuits(1976)19 cited
- → Ligation errors in DNA computing(1999)18 cited
- → Test generation for multiple faults based on parallel vector pair analysis(1993)17 cited
- → Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing(2008)10 cited
- → Comparison of Super-Junction Structures in 4H-SiC and Si for High Voltage Applications(2001)10 cited
- → Solution of the Knapsack Problem by Deoxyribonucleic Acid Computing(1998)8 cited
- Test Pattern Generation for Circuits with Three-state Modules by Improved Z-algorithm.(1986)