Y. Ohshima
Daido University(JP)
Publications by Year
Research Areas
Semiconductor materials and devices, Advanced Memory and Neural Computing, Advancements in Semiconductor Devices and Circuit Design, Ferroelectric and Negative Capacitance Devices, Advanced Data Storage Technologies
Most-Cited Works
- → Degradation mechanism of flash EEPROM programming after program/erase cycles(2002)67 cited
- → ONO inter-poly dielectric scaling for nonvolatile memory applications(1991)58 cited
- → A 16-Mb flash EEPROM with a new self-data-refresh scheme for a sector erase operation(1994)43 cited
- → A study of the effects of BGA solder geometry on fatigue life and reliability assessment(2002)35 cited
- → Power cycle reliability of Cu nanoparticle joints with mismatched coefficients of thermal expansion(2016)25 cited
- → Lucky-hole injection induced by band-to-band tunneling leakage in stacked gate transistors(2002)23 cited
- → Reliability study of thin inter-poly dielectrics for non-volatile memory application(2002)22 cited
- → Flip chip underfill reliability of CSP during IR reflow soldering(2002)14 cited
- → Bottom-oxide scaling for thin nitride/oxide interpoly dielectric in stacked-gate nonvolatile memory cells(1992)12 cited
- → A 62ns 16Mb CMOS EPROM With Address Transition Detection Technique(1991)11 cited