Suriyaprakash Natarajan
Siemens (Germany)(DE)Intel (United States)(US)Siemens Healthcare (United States)(US)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Low-power high-performance VLSI design, Radiation Effects in Electronics, VLSI and FPGA Design Techniques
Most-Cited Works
- → Toward Functional Safety of Systolic Array-Based Deep Learning Hardware Accelerators(2021)83 cited
- → Analysis of Defects and Variations in Embedded Spin Transfer Torque (STT) MRAM Arrays(2016)57 cited
- → Case Study on Speed Failure Causes in a Microprocessor(2008)35 cited
- → A Model Study of Defects and Faults in Embedded Spin Transfer Torque (STT) MRAM Arrays(2015)30 cited
- → The Region-Exhaustive Fault Model(2007)23 cited
- → Scalable and efficient analog parametric fault identification(2013)18 cited
- → Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation(2014)16 cited