Duckhyun Chang
Samsung (South Korea)(KR)
Publications by Year
Research Areas
CCD and CMOS Imaging Sensors, Advanced Fluorescence Microscopy Techniques, Image Processing Techniques and Applications, Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design
Most-Cited Works
- → Biscuit(2016)195 cited
- → Biscuit: A Framework for Near-Data Processing of Big Data Workloads(2016)98 cited
- → A 1/2.8-inch 24Mpixel CMOS image sensor with 0.9μm unit pixels separated by full-depth deep-trench isolation(2018)27 cited
- → An all pixel PDAF CMOS image sensor with 0.64μmx1.28μm photodiode separated by self-aligned in-pixel deep trench isolation for high AF performance(2017)23 cited
- → All-Directional Dual Pixel Auto Focus Technology in CMOS Image Sensors(2021)13 cited
- → Simplified energy-balance model for pragmatic multi-dimensional device simulation(1997)13 cited
- → A 1/1.57-inch 50Mpixel CMOS Image Sensor With 1.0μm All-Directional Dual Pixel by 0.5μm-Pitch Full-Depth Deep-Trench Isolation Technology(2022)9 cited
- → Temperature dependent hysteretic propagation delay in FB SOI inverter chain(2003)6 cited
- → Design and implementation of a mobile storage leveraging the DRAM interface(2016)2 cited
- → World's first 16:4:1 triple conversion gain sensor with all-pixel AF for 82.4dB single exposure HDR(2022)1 cited