A Near Edge X-ray Absorption Fine Structure Spectroscopy and X-ray Photoelectron Spectroscopy Study of the Film Properties of Self-Assembled Monolayers of Organosilanes on Oxidized Si(100)
Citations Over TimeTop 10% of 1995 papers
Abstract
ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTA Near Edge X-ray Absorption Fine Structure Spectroscopy and X-ray Photoelectron Spectroscopy Study of the Film Properties of Self-Assembled Monolayers of Organosilanes on Oxidized Si(100)K. Bierbaum, M. Kinzler, Ch. Woell, M. Grunze, G. Haehner, S. Heid, and F. EffenbergerCite this: Langmuir 1995, 11, 2, 512–518Publication Date (Print):February 1, 1995Publication History Published online1 May 2002Published inissue 1 February 1995https://pubs.acs.org/doi/10.1021/la00002a025https://doi.org/10.1021/la00002a025research-articleACS PublicationsRequest reuse permissionsArticle Views1847Altmetric-Citations214LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-Alertsclose Get e-Alerts
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